File:Tollansky.pdf
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Summary
| Description |
English: Principle idea of Tolansky-Method for measurement of layer thickness by interferometry. |
| Date | |
| Source | Own work |
| Author | Safe cracker |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 11:33, 21 December 2008 |  | 1,583 × 1,129 (69 KB) | Safe cracker | {{Information |Description={{en|1=Principle idea of Tolansky-Method for measurement of layer thickness by interferometry.}} |Source=Own work by uploader |Author=Safe cracker |Date=19.12.2008 |Permission= |other_versions= }} <!--{{Im |
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