File:Wafer prober service configuration.jpg
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Summary
| Description |
English: An Electroglas 4090μ+ semiconductor wafer prober in service configuration, with test head, probe card, cover panels and other accessories removed. Internal parts are shown; the linear motor and platen, chuck and stage and material handling elements are shown. |
| Date | |
| Source | MarTek, Inc. |
| Author | Ixnayonthetimmay |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 08:27, 6 October 2011 | | 1,500 × 1,165 (684 KB) | Ixnayonthetimmay |
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