File:SyntheSys Research Delay Technology.JPG
Original file (882 × 418 pixels, file size: 82 KB, MIME type: image/jpeg)
 | This is a file from the Wikimedia Commons. Information from its description page there is shown below. Commons is a freely licensed media file repository. You can help. |
Summary
| Description |
English: Principle behind delay-measuring technology. Small horizontal offset between top and bottom lines represent delay that is difficult to measure (see red oval). By superimposing unrelated frequency, offset is amplified and original shift can be calculated by knowing the two superimposed frequencies. (Effect may require 100% view scaling to see) |
||
| Date | |||
| Source | Own work | ||
| Author | Jimwaschura | ||
| Permission (Reusing this file) |
|
Licensing
- You are free:
- to share – to copy, distribute and transmit the work
- to remix – to adapt the work
- Under the following conditions:
- attribution – You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.
- share alike – If you remix, transform, or build upon the material, you must distribute your contributions under the same or compatible license as the original.
File history
Click on a date/time to view the file as it appeared at that time.
| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 17:24, 30 May 2013 | | 882 × 418 (82 KB) | Jimwaschura | User created page with UploadWizard |
File usage
The following page uses this file:
