File:Probes on bevel.jpg
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Summary
| Description | Illustration of the probing of a beveled piece of silicon. (Typically, 60 to 100 or more measurements are made.) |
| Source | Own work |
| Author | Rogerprocessengineer |
Licensing
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I, the copyright holder of this work, release this work into the public domain. This applies worldwide. In some countries this may not be legally possible; if so: I grant anyone the right to use this work for any purpose, without any conditions, unless such conditions are required by law. |
File history
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 20:10, 12 December 2008 | | 3,794 × 2,873 (454 KB) | Rogerprocessengineer | {{Information |Description=Illustration of the probing of a beveled piece of silicon. (Typically, 60 to 100 or more measurements are made.) |Source=self-made |Date= |Author= Rogerprocessengineer |Permission= |other_versions= |
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