File:Fib sample preparation tem.jpg
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Summary
| Description |
English: Images of the same thin film sample at different scales, showing the geometry of a transmission electron microscopy sample made using a focused ion beam. The two leftmost images are from the focused ion beam used to make the transmission electron microscopy sample, imaged using secondary electrons. The rightmost figure is a scanning transmission electron microscopy image, showing the atomic structure of the sample. |
| Date | |
| Source | Own work |
| Author | Magnunor |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 16:08, 22 October 2019 | | 2,400 × 800 (827 KB) | Magnunor | User created page with UploadWizard |
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